Specialized seminar

We would like to invite you to the specialized seminar on the topic Extraction of material properties based on measured data of Dr. Vratislav Sokol, (CST AG), organized by department of electromagnetic field on 21st October in the room B2-621 starting 2:30pm.

Abstract: Electromagnetic field simulators are used in a design of the MW/RF circuits in order to lower the number of prototypes reaching a good agreement to the measured results. Although the 3D EM modeling allow to pass through a challenging design process the robustness of the virtual prototyping strongly depends on the quality of the input parameters for EM simulator. One of the most critical issues is an accurate characterization of the material properties used in the 3D EM simulation. For the dielectric material we need to know a broadband dispersion of a complex permittivity (and/or permeability for ferrites), while the conductors exhibit a skin-depth effect, surface roughness and broadband permeability dispersion in a case of ENIG plating.
 
This seminar will present several extraction techniques of material properties based on the measured S-parameters of simple geometry samples using CST STUDIO SUITE®. The importance of a manufacturing technology in the extraction process will be discussed in a relation to the robustness of the particular technique. The most important effects like etch factor, over-etching, over-milling, metallization thickness and the connection repeatability of low-cost end-launchers will be addressed showing real-world examples.

Specialized seminar

We would like to invite you to the specialized seminar on the topic Calibration techniques for VNA – Myths & Facts of Ing. Milan Příhoda, (CST AG), organized by department of electromagnetic field on 14th October in the room B2-621 starting 2:30 pm.

Abstract: Vector Network Analyzer (VNA) is a device which is used in wide range applications. The modern VNA are very accurate and complex devices. Besides the large number of great RF and microwave hardware it also contains an integral non-hardware part - calibration techniques.  The mentioned RF and microwave hardware inside the VNA is very stable and accurate nowadays. It can be said, that calibration techniques dominantly affects the measurement results.

It is necessary to address the question of the appropriate test fixture arrangement (according to DUT) before each measurement. Test fixture arrangement has to be compatible with suitable technique in terms of calibration standards. Either non-optimal choice of suitable calibration technique or an improper design of calibration standards for a specified measurement scenario can lead to completely incorrect results.

The seminar will be focused on several issues. First the common mistakes that can occur during OSM and TOSM/UOSM calibration will be shown. Then advantages and disadvantages of TRL technique will be discussed. Finally an example of design of standards for Multiline-TRL technique will be demonstrated including verification measurement of Beatty standard up to 50GHz.

Notice

New article of RFID group was published in IEEE Transactions in September:

Polívka M., Švanda M.: Stepped Impedance Coupled-Patches Tag antenna for Platform-Tolerant UHF RFID Applications, IEEE Transactions on Antennas and Propagation, vol. 63, No. 9, pp. 3791-3797, September 2015.

Guest lecture

We would like to invite you to an IEEE AP-S Distinguished lecture "Convex Optimization for Analysis of Small Antennas" presented by prof. Mats Gustafsson, which will take place in the room B2-621 on 5th October at 2:30 pm. More information can be found in the attached invitation letter.

Notice

New article of RFID group was published in IEEE Transactions in May:

Švanda M., Polívka M.: Matching Technique for an On-Body Low-Profile Coupled-Patches UHF RFID Tag and for Sensor Antennas, IEEE Transactions on Antennas and Propagation, vol. 63, No. 5, pp. 2295-2301, May 2015.

Guest lecture

We would like to invite you on the guest lecture "The Wonderful World of Nonlinearity: Modeling and Characterization of RF and Microwave Circuits" presented by José Carlose Pedra, which will take place in the room 52 on 2nd June at 2:30 pm. More information can be found in the attached invitation letter.

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